The electronic components are used in several safety and maintenance systems that require accurate reliability prediction for higher availability. The traditional reliability prediction methods that draw on standard handbooks such as MIL-HDBK 217F, Telcordia, CNET etc., are inappropriate to determine the reliability indices of these components due to empirical methods does not comply with operating life cycle and technology advancements. The progressive reliability prediction methodology, the physics-of-failure (PoF), emphasizes the root cause of failure, failure analysis, and failure mechanisms based on the analysis of parameter characteristics. However, there is a limitation: it is sometimes difficult to obtain manufacturer’s details for failure analysis and quality information. Several statistical and probability modeling methods can be performed on the experimental data of these components to measure the time to failure. These experiments can be conducted using the accelerated-testing of dominant stress parameters such as voltage, current, temperature, radiation etc. In this paper, the combination of qualitative data from PoF approach and quantitative data from the statistical analysis is used to create a modified physics-of-failure approach. The critical electronic components used in certain safety systems from different technologies are chosen for reliability prediction: optocoupler, constant fraction discriminator, BJT transistor, voltage comparator, voltage follower and instrumentation amplifier is studied. The failure characteristics of each of the technologies are studied and compared according to operating conditions